Test Beyond JEDEC – SiC MOSFET Reliability Supplemental Tests
ID:134 View Protection:ATTENDEE Updated Time:2021-08-05 10:23:27 Hits:337 Oral Presentation

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Abstract
Test Beyond JEDEC – SiC MOSFET Reliability Supplemental Tests
Keywords
Speaker
Ye Zhong
CTO InventChip Technology Co., Ltd.

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