An Optimized Parameter Design Method for Desaturation Protection Circuit towards Fast Response Speed and Strong Noise Immunity
ID:70 Submission ID:156 View Protection:ATTENDEE Updated Time:2021-07-21 20:04:10 Hits:483 Oral Presentation

Start Time:2021-08-27 10:30 (Asia/Shanghai)

Duration:15min

Session:[Room2] Oral Session 2 [S5&S6] WBG Device Design and Gate Drivers

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Abstract
This paper presents a theoretical analysis and an optimized parameter design method of desaturation short-circuit protection for fast response speed and strong noise immunity. First, the mechanism of false triggering of desaturation protection are analyzed in detail, and based on the analysis several key related factors are identified. Second, a noise suppression ability evaluation method and a corresponding optimized parameter design method based on aforementioned analysis are proposed, which is capable of enhancing noise immunity without sacrificing response speed. Third, two typical desaturation protection circuits are compared with the proposed evaluation method and optimized parameter design examples are presented. Finally, simulation and experimental results are presented to validiate the proposed parameter optimization method.
Keywords
Desaturation,Short Circuit Protection,wide bandgap devices
Speaker
Cheng Qian
Huazhong University of Science and Technology

Submission Author
Cheng Qian Huazhong University of Science and Technology
智强 王 华中科技大学
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