The Latest Testing Methods and Solutions in Wide BandGap
ID：133 View Protection：ATTENDEE Updated Time：2021-08-24 10:47:11 Hits：658 Oral Presentation

Start Time：2021-08-27 10:50 （Asia/Shanghai）

Duration：25min

Session：[IS] Industry Session » [IS] Industry Session

No files

Abstract
The Latest Testing Methods and Solutions in Wide BandGap
Keywords
Speaker
Wanner Huang
Tektronix Senior Bus Tektronix(China)Co.,Ltd.

Comment submit
Verification code Change another
All comments

wipda-asia-2021@hust.edu.cn

Copyright © IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia
Powered by Aconf.org, One-stop Solutions for Academic Events

Manage the conference