Timezone:Asia/Shanghai

Day 3,Aug. 27, 2021Friday

S1&S2

WBG Device Modeling, Simulation and Reliability@Oral Session 1

2021-08-27 08:30 ~ 11:30

ZOOM Conference Enter meeting room

Timetable V13 Updated:2021-09-01 08:33:01

Start End Duration ID Title
Device Modeling and Simulation
Chair: Yu Chen, Huazhong University of Science and Technology / Xiaochuan Deng, University of Electronic Science and Technology of China
08:30 08:45 15 1
Oral Presentation
08:45 09:00 15 73
Oral Presentation
09:00 09:15 15 99
09:15 09:30 15 89
A Compact Model for Si/SiC IGBT in LTspice with Experimental Validation
Md Maksudul Hossain Graduate Research As/UNIVERSITY OF ARKANSAS
Oral Presentation
09:30 09:45 15 Coffee Break
WBG Device Reliability
Chair: Meng Huang, Wuhan University / Qing Guo, Zhejiang University
09:45 10:00 15 114
Analysis of GaN HEMT Degradation under RF Overdrive Stress
YiQiang Chen/The No.5 Electronics Research Institute of the Ministry of Industry and Information Technology;YuHan Xie/,South China University of Technology
Oral Presentation
10:00 10:15 15 116
Analysis of the influence of vibration and thermal vibration coupling on the power module
JiaJia Guan/Huazhong University of Science and Technology
Oral Presentation
10:15 10:30 15 85
10:30 10:45 15 86
Failure Analysis of 200V p-GaN HEMT under Unclamped Inductive Switching Conditions
Xuan Li/University of Electronic Science and Technology of China
Oral Presentation
10:45 11:00 15 110
Characteristics of SiC MOSFET in a Wide Temperature Range
Mengyu Zhu/Xi'an Jiaotong University
Oral Presentation
S3&S4

WBG Device Applications, Package Design & Analysis@Oral Session 1

2021-08-27 14:00 ~ 17:30

ZOOM Conference Enter meeting room

Timetable V13 Updated:2021-09-01 08:33:01

Start End Duration ID Title
WBG Device Applications
Chair: Xuehua Wang, Huazhong University of Science and Technology / Haoze Luo, Zhejiang University
14:00 14:15 15 82
14:15 14:30 15 90
Analysis of an Output Series High Voltage Gain Impedance Source Circuit Based on SiC Switch
Qing Cheng/China,School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin
Oral Presentation
14:30 14:45 15 80
Homogeneous-Flux Transmitter Coil Design with Improved Position Tolerance
Yunfeng Liu/Department of Electrical Engineering, Technical University of Denmark
Oral Presentation
14:45 15:00 15 72
Oral Presentation
15:00 15:15 15 88
Adaptive Digital Technique Assisted Hard Switching Fault Detection for SiC MOSFETs
Saravanan Dhanasekaran Research Scholar/Indian Institute of Technology Madras
Oral Presentation
15:15 15:30 15 Coffee Break
WBG Device Package Design & Analysis
Chair: Jianing Wang, Hefei University of Technology / Cai Chen, Huazhong University of Science and Technology
15:30 15:45 15 109
Oral Presentation
15:45 16:00 15 93
16:00 16:15 15 77
A High Power Density Chip-on-Chip Gan-based Module with Ultra-Low Parasitic Inductance
Yi Zhang/Huazhong University of Science and Technology,State Key Laboratory of Advanced Electromagnetic Engineering and Technology
Oral Presentation
16:15 16:30 15 100
15kV Press Pack SiC IGBT
yujie du/,Global Energy Interconnection Research Institute Co.,ltd
Oral Presentation
16:30 16:45 15 71
Oral Presentation
16:45 17:00 15 98